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STRUCTURAL CHARACTERIZATION OF THE LAYERED COMPOUND Ag2SnSe3 FROM SCANNING AND TRANSMISSION ELECTRON MICROSCOPY AND SYNCHROTRON POWDER DIFFRACTION
(Comité Interamericano de Sociedades para Microscopía Electrónica - CIASEM, 2016-11)
In this paper, a study of structural characterization of the ternary semiconductor Ag2SnSe3 is presented. The experimental work was performed using Scanning Electron Microscopy (SEM), Selected Area Electron Diffraction ...
STRUCTURAL CHARACTERIZATION OF THE LAYERED COMPOUND Ag2SnSe3 FROM SCANNING AND TRANSMISSION ELECTRON MICROSCOPY AND SYNCHROTRON POWDER DIFFRACTION
(Comité Interamericano de Sociedades para Microscopía Electrónica - CIASEM, 2016-11)
In this paper, a study of structural characterization of the ternary semiconductor Ag2SnSe3 is presented. The experimental work was performed using Scanning Electron Microscopy (SEM), Selected Area Electron Diffraction ...