Buscar
Mostrando ítems 1-3 de 3
STRUCTURAL CHARACTERIZATION OF THE LAYERED COMPOUND Ag2SnSe3 FROM SCANNING AND TRANSMISSION ELECTRON MICROSCOPY AND SYNCHROTRON POWDER DIFFRACTION
(Comité Interamericano de Sociedades para Microscopía Electrónica - CIASEM, 2016-11)
In this paper, a study of structural characterization of the ternary semiconductor Ag2SnSe3 is presented. The experimental work was performed using Scanning Electron Microscopy (SEM), Selected Area Electron Diffraction ...
MICROSTRUCTURAL EVOLUTION AND MECHANICAL PROPERTY─FRACTAL BEHAVIOR RELATIONS OF AN AGED SUPER DUPLEX STAINLESS STEEL
(Comité Interamericano de Sociedades para Microscopía Electrónica - CIASEM, 2016-11)
We studied the relation between the mechanical properties and the fractal dimensional increment for 40 V–notch Charpy and 16 round tensile samples of SAF 2507 super duplex stainless steel, aged between 0 and 288 h at 475 ...
STRUCTURAL CHARACTERIZATION OF THE LAYERED COMPOUND Ag2SnSe3 FROM SCANNING AND TRANSMISSION ELECTRON MICROSCOPY AND SYNCHROTRON POWDER DIFFRACTION
(Comité Interamericano de Sociedades para Microscopía Electrónica - CIASEM, 2016-11)
In this paper, a study of structural characterization of the ternary semiconductor Ag2SnSe3 is presented. The experimental work was performed using Scanning Electron Microscopy (SEM), Selected Area Electron Diffraction ...